Cita APA (7th ed.)

Chien-Mo Li, J. Diagnosis of single stuck-at faults and multiple timing faults in scan chains. IEEE Transactions on VLSI systems.

Cita Chicago (17th ed.)

Chien-Mo Li, J. "Diagnosis of Single Stuck-at Faults and Multiple Timing Faults in Scan Chains." IEEE Transactions on VLSI Systems .

Cita MLA (9th ed.)

Chien-Mo Li, J. "Diagnosis of Single Stuck-at Faults and Multiple Timing Faults in Scan Chains." IEEE Transactions on VLSI Systems, .