Chien-Mo Li, J. Diagnosis of single stuck-at faults and multiple timing faults in scan chains. IEEE Transactions on VLSI systems.
Citazione stile Chigago Style (17a edizione)Chien-Mo Li, J. "Diagnosis of Single Stuck-at Faults and Multiple Timing Faults in Scan Chains." IEEE Transactions on VLSI Systems .
Citatione MLA (9a ed.)Chien-Mo Li, J. "Diagnosis of Single Stuck-at Faults and Multiple Timing Faults in Scan Chains." IEEE Transactions on VLSI Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.