Sharma, A. Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver. IEEE Transactions on VLSI systems.
Chicago-referens (17:e uppl.)Sharma, A. "Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver." IEEE Transactions on VLSI Systems .
MLA-referens (9:e uppl.)Sharma, A. "Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver." IEEE Transactions on VLSI Systems, .
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