Autoscan a scan design without external scan inputs or outputs.

Autoscan a scan design without external scan inputs or outputs.

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...

全面介绍

书目详细资料
发表在:IEEE Transactions on VLSI systems 13, 9 (2005).
主要作者: Pomeranz, I.
格式: 文件
语言:English
主题:
Autoscan.
Design for testability technique.
Fault diagnosis.
Scan design.
Synchronous sequential circuits.
Test generation procedure.