Autoscan a scan design without external scan inputs or outputs.

Autoscan a scan design without external scan inputs or outputs.

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...

Полное описание

Библиографические подробности
Опубликовано в::IEEE Transactions on VLSI systems 13, 9 (2005).
Главный автор: Pomeranz, I.
Формат: Статья
Язык:English
Предметы:
Autoscan.
Design for testability technique.
Fault diagnosis.
Scan design.
Synchronous sequential circuits.
Test generation procedure.