Autoscan a scan design without external scan inputs or outputs.

We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under...

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Manylion Llyfryddiaeth

Cyhoeddwyd yn:	IEEE Transactions on VLSI systems 13, 9 (2005).
Prif Awdur:	Pomeranz, I.
Fformat:	Erthygl
Iaith:	English
Pynciau:	Autoscan. Design for testability technique. Fault diagnosis. Scan design. Synchronous sequential circuits. Test generation procedure.