Voyiatzis, I. Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Transactions on VLSI systems.
Chicago-Zitierstil (17. Ausg.)Voyiatzis, I. "Accumulator-based Test Generation for Robust Sequential Fault Testing in DSP Cores in Near-optimal Time." IEEE Transactions on VLSI Systems .
MLA-Zitierstil (9. Ausg.)Voyiatzis, I. "Accumulator-based Test Generation for Robust Sequential Fault Testing in DSP Cores in Near-optimal Time." IEEE Transactions on VLSI Systems, .
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.