Cita APA

Voyiatzis, I. Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Transactions on VLSI systems.

Citación estilo Chicago

Voyiatzis, I. "Accumulator-based Test Generation for Robust Sequential Fault Testing in DSP Cores in Near-optimal Time." IEEE Transactions on VLSI Systems .

Cita MLA

Voyiatzis, I. "Accumulator-based Test Generation for Robust Sequential Fault Testing in DSP Cores in Near-optimal Time." IEEE Transactions on VLSI Systems, .