Equivalent circuit model of on-wafer CMOS interconnects for RFICs.

Equivalent circuit model of on-wafer CMOS interconnects for RFICs.

This paper investigates the properties of the on-wafer interconnects built in a 0.18-μm CMOS technology for RF applications. A scalable equivalent circuit model is developed. The model parameters are extracted directly from the on-wafer measurements and formulated into empirical expressions. The exp...

Täydet tiedot

Bibliografiset tiedot
Julkaisussa:IEEE Transactions on VLSI systems 13, 9 (2005).
Päätekijä: Xiaomeng Shi
Aineistotyyppi: Artikkeli
Kieli:English
Aiheet:
0.18 micron.
RF CMOS interconnects.
RFIC.
Circuit simulation.
Lumped equivalent circuit model.
On-wafer measurements.
Scattering parameters measurement.
Skin effect.
Substrate losses.