Qikai Chen. Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. IEEE Transactions on VLSI systems.
Chicago Style (17th ed.) CitationQikai Chen. "Efficient Testing of SRAM with Optimized March Sequences and a Novel DFT Technique for Emerging Failures Due to Process Variations." IEEE Transactions on VLSI Systems .
MLA (9th ed.) CitationQikai Chen. "Efficient Testing of SRAM with Optimized March Sequences and a Novel DFT Technique for Emerging Failures Due to Process Variations." IEEE Transactions on VLSI Systems, .
Warning: These citations may not always be 100% accurate.