Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.

Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.

Asynchronous design offers a solution to the interconnect problems faced by system-on-chip (SoC) designers, but their adoption has been held back by a lack of methodology and support for post-fabrication testing. This paper first addresses the problem of testing C-elements, an important building blo...

詳細記述

書誌詳細
出版年:IEEE Transactions on VLSI systems 13, 12 (2005).
第一著者: Efthymiou, A.
フォーマット: 論文
言語:English
主題:
ATPG.
C-element testability.
Asynchronous interconnect.
Building block.
Globally-asynchronous locally-synchronous.
Interconnect fabric.
Interconnect topology.
Level-sensitive scan devices.
Network-on-chip.
Partial-scan methodology.
Scan-testing.
Stuck-at fault testing.
Synchronous circuit.
System-on-chip design.
Test pattern generation.