Cita APA (7th ed.)

Efthymiou, A. Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. IEEE Transactions on VLSI systems.

Cita Chicago (17th ed.)

Efthymiou, A. "Test Pattern Generation and Partial-scan Methodology for an Asynchronous SoC Interconnect." IEEE Transactions on VLSI Systems .

Cita MLA (9th ed.)

Efthymiou, A. "Test Pattern Generation and Partial-scan Methodology for an Asynchronous SoC Interconnect." IEEE Transactions on VLSI Systems, .