Efthymiou, A. Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. IEEE Transactions on VLSI systems.
Citace podle Chicago (17th ed.)Efthymiou, A. "Test Pattern Generation and Partial-scan Methodology for an Asynchronous SoC Interconnect." IEEE Transactions on VLSI Systems .
Citace podle MLA (9th ed.)Efthymiou, A. "Test Pattern Generation and Partial-scan Methodology for an Asynchronous SoC Interconnect." IEEE Transactions on VLSI Systems, .
Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..