Sultania, A. Gate oxide leakage and delay tradeoffs for dual-Tox circuits. IEEE Transactions on VLSI systems.
Chicagoスタイル(17版)引用形式Sultania, A.K. "Gate Oxide Leakage and Delay Tradeoffs for Dual-Tox Circuits." IEEE Transactions on VLSI Systems .
MLA(9版)引用形式Sultania, A.K. "Gate Oxide Leakage and Delay Tradeoffs for Dual-Tox Circuits." IEEE Transactions on VLSI Systems, .
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