APA (7th ed.) Citation

Sultania, A. Gate oxide leakage and delay tradeoffs for dual-Tox circuits. IEEE Transactions on VLSI systems.

Chicago Style (17th ed.) Citation

Sultania, A.K. "Gate Oxide Leakage and Delay Tradeoffs for Dual-Tox Circuits." IEEE Transactions on VLSI Systems .

MLA (9th ed.) Citation

Sultania, A.K. "Gate Oxide Leakage and Delay Tradeoffs for Dual-Tox Circuits." IEEE Transactions on VLSI Systems, .

Warning: These citations may not always be 100% accurate.