An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs.

An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs.

We have experimentally studied the diffused electron clouds formed by X-ray photons interacting within the undepleted bulk of silicon beneath the depleted region of an X-ray CCD. Usually, such events are spread over multiple pixels and are often rejected in data analysis because of incomplete charge...

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Bibliographic Details
Published in:IEEE Transactions on electron devices 50, 1 (2003).
Main Author: Prigozhin, G.
Format: Article
Language:English
Subjects:
2048 pixel.
4096 pixel.
8388608 pixel.
Si.
X-ray CCDs.
X-ray photon energy information retrieval.
Charge cloud shape.
Charge diffusion.
Depleted region.
Diffused electron clouds.
Diffusion length.
Incomplete charge collection.
One-dimensional representation.
Partially depleted CCD sensitivity.
Serial register.
Signal/noise ratio.
Undepleted Si bulk.
Unusual CCD clocking mode.
Mn Kα lines.
Mn Kβ lines.
Radioactive Fe55 source.