APA (7th ed.) Citation

Bogaerts, J. Total dose and displacement damage effects in a radiation-hardened CMOS APS. IEEE Transactions on electron devices.

Chicago Style (17th ed.) Citation

Bogaerts, J. "Total Dose and Displacement Damage Effects in a Radiation-hardened CMOS APS." IEEE Transactions on Electron Devices .

MLA (9th ed.) Citation

Bogaerts, J. "Total Dose and Displacement Damage Effects in a Radiation-hardened CMOS APS." IEEE Transactions on Electron Devices, .

Warning: These citations may not always be 100% accurate.