APA (7e ed.) Bronvermelding

Loukianova, N. Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. IEEE Transactions on electron devices.

Chicago (17e ed.) Bronvermelding

Loukianova, N.V. "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors." IEEE Transactions on Electron Devices .

MLA (9e ed.) Bronvermelding

Loukianova, N.V. "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors." IEEE Transactions on Electron Devices, .