APA (7th ed.) Citation

Loukianova, N. Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. IEEE Transactions on electron devices.

Chicago Style (17th ed.) Citation

Loukianova, N.V. "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors." IEEE Transactions on Electron Devices .

MLA (9th ed.) Citation

Loukianova, N.V. "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors." IEEE Transactions on Electron Devices, .