Dyfyniad APA

Takayanagi, I. Dark current reduction in stacked-type CMOS-APS for charged particle imaging. IEEE Transactions on electron devices.

Dyfyniad Arddull Chicago

Takayanagi, I. "Dark Current Reduction in Stacked-type CMOS-APS for Charged Particle Imaging." IEEE Transactions on Electron Devices .

Dyfyniad MLA

Takayanagi, I. "Dark Current Reduction in Stacked-type CMOS-APS for Charged Particle Imaging." IEEE Transactions on Electron Devices, .

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.