3-D optical and electrical simulation for CMOS image sensors.
The optical and electrical characteristics of CMOS image sensors, such as readout, saturation, reset, charge-voltage conversion, and crosstalk characteristics, are analyzed by a three-dimensional (3-D) device simulator SPECTRA and a 3-D optical simulator TOCCATA which were developed for the analysis...
| Veröffentlicht in: | IEEE Transactions on electron devices 50, 1 (2003). |
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| Format: | Artikel |
| Sprache: | English |
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