3-D optical and electrical simulation for CMOS image sensors.

3-D optical and electrical simulation for CMOS image sensors.

The optical and electrical characteristics of CMOS image sensors, such as readout, saturation, reset, charge-voltage conversion, and crosstalk characteristics, are analyzed by a three-dimensional (3-D) device simulator SPECTRA and a 3-D optical simulator TOCCATA which were developed for the analysis...

وصف كامل

التفاصيل البيبلوغرافية
الحاوية / القاعدة:IEEE Transactions on electron devices 50, 1 (2003).
المؤلف الرئيسي: Mutoh, H.
التنسيق: مقال
اللغة:English
الموضوعات:
3D device simulator.
CMOS image sensors.
SPECTRA.
TOCCATA.
Buried photodiode.
Charge-voltage conversion.
Crosstalk characteristics.
Electrical characteristics.
Photodiode saturation condition.
Potential barrier.
Ray-tracing.
Readout.
Readout operation.
Reset.
Reset operation.
Saturation.
Thermal diffusion.
Transient simulation.