APA (7th ed.) Citation

Meneghesso, G. Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs. IEEE Transactions on electron devices.

Chicago Style (17th ed.) Citation

Meneghesso, G. "Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in GaAs MESFETs and HEMTs." IEEE Transactions on Electron Devices .

MLA (9th ed.) Citation

Meneghesso, G. "Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in GaAs MESFETs and HEMTs." IEEE Transactions on Electron Devices, .