Theoretical study of a GaN-AlGaN high electron mobility transistor including a nonlinear polarization model.

We present a theoretical model of an AlGaN-GaN high electron mobility field effect transistor (HEMT) that includes a nonlinear model of the strain polarization fields produced at the heterointerface. Recent experimental work has indicated that the macroscopic polarization in III-nitride alloys is a...

詳細記述

書誌詳細
出版年:IEEE Transactions on electron devices 50, 2 (2003).
第一著者: Tsung-Hsing Yu
フォーマット: 論文
言語:English
主題: