Theoretical study of a GaN-AlGaN high electron mobility transistor including a nonlinear polarization model.

We present a theoretical model of an AlGaN-GaN high electron mobility field effect transistor (HEMT) that includes a nonlinear model of the strain polarization fields produced at the heterointerface. Recent experimental work has indicated that the macroscopic polarization in III-nitride alloys is a...

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Publié dans:	IEEE Transactions on electron devices 50, 2 (2003).
Auteur principal:	Tsung-Hsing Yu
Format:	Article
Langue:	English
Sujets:	GaN-AlGaN. GaN-AlGaN HEMT. GaN-AlGaN heterointerface. MODFETs. Current-voltage characteristics. Cutoff frequency. Material composition. Nonlinear model. Nonlinear polarization model. Quasi-2D model. Quasi-two-dimensional model. Sheet carrier density. Strain polarization fields. Theoretical model. Transconductance.