Sawada, K. Elimination of kink phenomena and drain current hysteresis in InP-based HEMTs with a direct ohmic structure. IEEE Transactions on electron devices.
Chicago Style (17th ed.) CitationSawada, K. "Elimination of Kink Phenomena and Drain Current Hysteresis in InP-based HEMTs with a Direct Ohmic Structure." IEEE Transactions on Electron Devices .
MLA引文Sawada, K. "Elimination of Kink Phenomena and Drain Current Hysteresis in InP-based HEMTs with a Direct Ohmic Structure." IEEE Transactions on Electron Devices, .
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