Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects.

Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects.

Noise effects such as power supply and crosstalk noise can significantly impact the performance of deep submicrometer designs. Existing delay testing and timing analysis techniques cannot capture the effects of noise on the signal/cell delays. Therefore, these techniques cannot capture the worst cas...

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Détails bibliographiques
Publié dans:IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
Auteur principal: Krstic, A.
Format: Article
Langue:English
Sujets:
Benchmark circuits.
Crosstalk noise.
Deep submicrometer designs.
Delay testing.
Dynamic timing analysis.
Pattern generation.
Power supply noise.
Power-supply noise effects.
Propagation delays.
Timing analysis techniques.
Worst case timing scenarios.