Krstic, A. Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects. IEEE Transactions on computer-aided design of integrated circuits and systems.
Citazione stile Chigago Style (17a edizione)Krstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
Citatione MLA (9a ed.)Krstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.