Krstic, A. Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationKrstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationKrstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.