Krstic, A. Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago-referens (17:e uppl.)Krstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA-referens (9:e uppl.)Krstic, A. "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power-supply Noise Effects." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
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