Software-based self-testing methodology for processor cores.

Software-based self-testing methodology for processor cores.

At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost high-quality self-test methodologies that can be used by processors to test themselves at-speed. Currently, built-in self-test (BIST) is the...

詳細記述

書誌詳細
出版年:IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
第一著者: Li Chen
フォーマット: 論文
言語:English
主題:
BIST.
At-speed test.
At-speed testing.
Complex logic designs.
Cost/fault coverage benefits.
Gigahertz processors.
Logic-BIST tool.
Processor cores.
Self-test methodologies.
Self-test signatures.
Software-based self-testing methodology.
Structural tests.
Test application.
Test generation.