Software-based self-testing methodology for processor cores.

At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost high-quality self-test methodologies that can be used by processors to test themselves at-speed. Currently, built-in self-test (BIST) is the...

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Foilsithe in:IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
Príomhchruthaitheoir: Li Chen
Formáid: Alt
Teanga:English
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