Design of hierarchical cellular automata for on-chip test pattern generator.

Design of hierarchical cellular automata for on-chip test pattern generator.

This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field GF(2(pqr..)), where each cell of the CA can store and process a symbol in the extension field GF (2(pqr..)). The hierarchical field structure of GF(2(pqr..)) is e...

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Publié dans:IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002).
Auteur principal: Sikdar, B.K
Format: Article
Langue:English
Sujets:
BIST.
Galois extension field.
HCA-based test pattern generator.
VLSI circuit testing.
Fault coverage.
Hierarchical cellular automata.
Hierarchical field structure.
Hierarchical structural description.
On-chip test pattern generator.
Percentile improvement.
Symbol processing.