00000cab a22000003a 4500 UP-99796217609500588 Buklod 20231007234343.0 m |o d | ta 101013s xx d | ||r ||||| || DENGII eng Sikdar, B.K. Design of hierarchical cellular automata for on-chip test pattern generator. pp. 1530-1539 This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field GF(2(pqr..)), where each cell of the CA can store and process a symbol in the extension field GF (2(pqr..)). The hierarchical field structure of GF(2(pqr..)) is employed for design of an HCA-based test pattern generator (HCATPG). The HCATPG is ideally suited for testing very large scale integration circuits specified in hierarchical structural description. Experimental results establish the fact that the HCATPG achieves higher fault coverage than that which could be achieved with any other test structures. The concept of percentile improvement in fault coverage is introduced to have a realistic assessment of fault coverage achieved with the proposed RCATPG. BIST. Galois extension field. HCA-based test pattern generator. VLSI circuit testing. Fault coverage. Hierarchical cellular automata. Hierarchical field structure. Hierarchical structural description. On-chip test pattern generator. Percentile improvement. Symbol processing. IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002). FO UPD DENG-II Article