Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents a comprehensive computer-aided design tool for ESD applications. Specifically, the authors develop an improved and robust MOS model and implement such a model into the industry standard Cadence SPICE...
| 出版年: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
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