A framework for testing special-purpose memories.

A framework for testing special-purpose memories.

Current memory testing methods rely on fault models that are inadequate to accurately represent potential defects that occur in modern, often specialized, memories. To remedy this, the authors present a formal framework for modeling and testing special-purpose memories. Their approach uses three mod...

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Bibliografische gegevens
Gepubliceerd in:IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002).
Hoofdauteur: Sidorowicz, P.R
Formaat: Artikel
Taal:English
Onderwerpen:
Bridging fault.
Content-addressable memory.
Event-sequence model.
Fault model.
Finite-state machine.
Parametric test.
Special-purpose memory testing.
Stuck-at fault.
Stuck-open fault.
Transistor circuit.
Transistor fault.