SPIRIT a highly robust combinational test generation algorithm.
In this paper, an efficient test pattern generation (TPG) algorithm for combinational circuits based on the Boolean satisfiability method (SAT) is presented. The authors propose a new data structure for the complete implication graph that increases the precision of implication process. Next, they ex...
| הוצא לאור ב: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 12 (2002). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |