Gizdarski, E. SPIRIT: A highly robust combinational test generation algorithm. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationGizdarski, E. "SPIRIT: A Highly Robust Combinational Test Generation Algorithm." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationGizdarski, E. "SPIRIT: A Highly Robust Combinational Test Generation Algorithm." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.