Cita APA (7th ed.)

Gizdarski, E. SPIRIT: A highly robust combinational test generation algorithm. IEEE Transactions on computer-aided design of integrated circuits and systems.

Cita Chicago (17th ed.)

Gizdarski, E. "SPIRIT: A Highly Robust Combinational Test Generation Algorithm." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Cita MLA (9th ed.)

Gizdarski, E. "SPIRIT: A Highly Robust Combinational Test Generation Algorithm." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .