Partial BIST insertion to eliminate data correlation.
A new partial built-in self-test (BIST) insertion approach based on eliminating data correlation to improve pseudorandom testability is presented. Data correlation causes the circuit to be in a subset of states more or less frequently, which leads to low fault coverage in pseudorandom test. One impo...
| প্রকাশিত: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003). |
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| প্রধান লেখক: | |
| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| বিষয়গুলি: |