Partial BIST insertion to eliminate data correlation.
A new partial built-in self-test (BIST) insertion approach based on eliminating data correlation to improve pseudorandom testability is presented. Data correlation causes the circuit to be in a subset of states more or less frequently, which leads to low fault coverage in pseudorandom test. One impo...
| Publicat a: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003). |
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| Autor principal: | |
| Format: | Article |
| Idioma: | English |
| Matèries: |