Power supply transient signal analysis for defect-oriented test.
Transient signal analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is performed by applying linear regression analysis to the time or frequency domain representations of these signals. C...
| הוצא לאור ב: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |