Power supply transient signal analysis for defect-oriented test.

Power supply transient signal analysis for defect-oriented test.

Transient signal analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is performed by applying linear regression analysis to the time or frequency domain representations of these signals. C...

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Bibliografske podrobnosti
izdano v:IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003).
Glavni avtor: Plusquellic, J.
Format: Article
Jezik:English
Teme:
IDDT testing.
Cross-correlation profile.
Defect-oriented test.
Delay fault detection.
Frequency domain representations.
Linear regression analysis.
Power port measurements.
Power supply transient signal analysis.
Testing method.
Time domain representations.
Transient waveforms.