Power supply transient signal analysis for defect-oriented test.

Transient signal analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is performed by applying linear regression analysis to the time or frequency domain representations of these signals. C...

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Xuất bản năm:	IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003).
Tác giả chính:	Plusquellic, J.
Định dạng:	Bài viết
Ngôn ngữ:	English
Những chủ đề:	IDDT testing. Cross-correlation profile. Defect-oriented test. Delay fault detection. Frequency domain representations. Linear regression analysis. Power port measurements. Power supply transient signal analysis. Testing method. Time domain representations. Transient waveforms.