A unified approach to reduce SOC test data volume, scan power and testing time.
We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time, and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. We present a formal analysis of the amount of data compres...
| Xuất bản năm: | IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003). |
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| Tác giả chính: | |
| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Những chủ đề: |