توثيق جمعية علم النفس الأمريكية APA (الطبعة السابعة)

Chandra, A. A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Transactions on computer-aided design of integrated circuits and systems.

توثيق أسلوب شيكاغو (الطبعة السابعة عشر)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .