Cita APA (7th ed.)

Chandra, A. A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Transactions on computer-aided design of integrated circuits and systems.

Cita Chicago (17th ed.)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Cita MLA (9th ed.)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .