Style de citation APA (7e éd.)

Chandra, A. A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Transactions on computer-aided design of integrated circuits and systems.

Style de citation Chicago (17e éd.)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Style de citation MLA (9e éd.)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .