Citazione Stile APA (7a Edizione)

Chandra, A. A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Transactions on computer-aided design of integrated circuits and systems.

Citazione stile Chigago Style (17a edizione)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Citatione MLA (9a ed.)

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .