Citação norma APA

Chandra, A. A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Transactions on computer-aided design of integrated circuits and systems.

Citação norma Chicago

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Citação norma MLA

Chandra, A. "A Unified Approach to Reduce SOC Test Data Volume, Scan Power and Testing Time." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .

Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.