Testing ASICs with multiple identical cores.

Testing ASICs with multiple identical cores.

Predesigned cores and reusable modules are popularly used in the design of large and complex application specific integrated circuits (ASICs). As the size and complexity of ASICs increase, the test effort, including test development effort, test data volume, and test application time, has also signi...

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書目詳細資料
發表在:IEEE Transactions on computer-aided design of integrated circuits and systems 22, 3 (2003).
主要作者: Yuejian Wu
格式: Article
語言:English
主題:
ASIC testing.
ATPG.
BIST.
DFT technique.
Application specific ICs.
Design for testability technique.
Embedded cores.
Multiple identical cores.
Test application time reduction.
Test data volume reduction.
Test generation effort reduction.