Yuejian Wu. Testing ASICs with multiple identical cores. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationYuejian Wu. "Testing ASICs with Multiple Identical Cores." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationYuejian Wu. "Testing ASICs with Multiple Identical Cores." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.