Cita APA

Ruifeng Guo. Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Transactions on computer-aided design of integrated circuits and systems.

Citación estilo Chicago

Ruifeng Guo. "Reverse-order-restoration-based Static Test Compaction for Synchronous Sequential Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .

Cita MLA

Ruifeng Guo. "Reverse-order-restoration-based Static Test Compaction for Synchronous Sequential Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .