Ruifeng Guo. Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Transactions on computer-aided design of integrated circuits and systems.
Chicago Style (17th ed.) CitationRuifeng Guo. "Reverse-order-restoration-based Static Test Compaction for Synchronous Sequential Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems .
MLA (9th ed.) CitationRuifeng Guo. "Reverse-order-restoration-based Static Test Compaction for Synchronous Sequential Circuits." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, .
Warning: These citations may not always be 100% accurate.