Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films.

Superconducting and normal state properties of the useful film material NbxTi1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb0.62Ti0.38N thin films is determined to be 2.4±0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to expe...

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Bibliographic Details
Published in:	IEEE Transactions on applied superconductivity 12, 2 (2002).
Main Author:	Lei Yu
Format:	Article
Language:	English
Subjects:	Coherence length. De Gennes-Werthamer theory. Digital logic circuits. Energy gap. Lattice-matched substrates. Normal state properties. Pentalayer SNS structures. Proximity-induced depression. Rapid single flux quantum circuits. Sputtered thin films. Superconducting properties. Temperature-dependent resistivity. Transition temperature. Zero-temperature Ginzburg-Landau length. Nb0.62Ti0.38N.