Runyon, S. Testing big chips becomes an internal affair. IEEE spectrum.
Cita Chicago Style (17a ed.)Runyon, S. "Testing Big Chips Becomes an Internal Affair." IEEE Spectrum .
Cita MLA (9a ed.)Runyon, S. "Testing Big Chips Becomes an Internal Affair." IEEE Spectrum, .
Precaución: Estas citas no son 100% exactas.