<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd" xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>00000cab a22000003a 4500</leader>
  <controlfield tag="001">UP-99796217609436538</controlfield>
  <controlfield tag="003">Buklod</controlfield>
  <controlfield tag="005">20231007234216.0</controlfield>
  <controlfield tag="006">m    |o  d |      </controlfield>
  <controlfield tag="007">ta</controlfield>
  <controlfield tag="008">100902s        xx     d | ||r |||||   ||</controlfield>
  <datafield tag="040" ind1=" " ind2=" ">
   <subfield code="a">DENGII</subfield>
  </datafield>
  <datafield tag="041" ind1=" " ind2=" ">
   <subfield code="a">eng</subfield>
  </datafield>
  <datafield tag="100" ind1="0" ind2=" ">
   <subfield code="a">Kaplan, G.</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Industrial electronics [Technology 2000 analysis and forecast].</subfield>
  </datafield>
  <datafield tag="300" ind1=" " ind2=" ">
   <subfield code="a">pp. 104-109</subfield>
  </datafield>
  <datafield tag="520" ind1=" " ind2=" ">
   <subfield code="a">Energy savings and higher intelligence are hallmarks of today's highly competitive world of industrial automation. While power electronics devices and systems deliver ever more watts, they also contribute to electromagnetic interference (EMI), and users are becoming aware of the need to increase their overall system reliability. Teetering on the verge of acceptance are easily programmable service robots, automatically cleaning their way around public facilities. At the same time, researchers are exploring the possibility of using magnetic resonance imaging (MRI) technology on the factory floor. Both the water content of products and their material hardness are being analyzed by MRI scans to monitor product quality. For embedded systems designers, who have the complex task of testing and debugging embedded processors, relief is in the offing with a new, global standard. The standard, for a device interface for embedded processors, should simplify the testing and debugging of the processors used in such fields as automotive electronics, aerospace, telecommunications, appliances, and consumer electronics. Simplifying those tasks ought to shorten the time to market of products and systems in most, if not all, of these areas</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">EMI.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">MRI.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Aerospace.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Automatic cleaning robots.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Automotive electronics.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Consumer electronics.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Electromagnetic interference.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Embedded processors.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Energy savings.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Industrial automation.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Intelligence.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Magnetic resonance imaging.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Material hardness.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Power electronics devices.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Processors debugging.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Product quality monitoring.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Programmable service robots.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">System reliability increase.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Technology forecast.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Telecommunications.</subfield>
  </datafield>
  <datafield tag="653" ind1=" " ind2=" ">
   <subfield code="a">Water content.</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">IEEE spectrum</subfield>
   <subfield code="g">37, 1 (2000).</subfield>
  </datafield>
  <datafield tag="905" ind1=" " ind2=" ">
   <subfield code="a">FO</subfield>
  </datafield>
  <datafield tag="852" ind1=" " ind2=" ">
   <subfield code="a">UPD</subfield>
   <subfield code="b">DENG-II</subfield>
  </datafield>
  <datafield tag="942" ind1=" " ind2=" ">
   <subfield code="a">Article</subfield>
  </datafield>
 </record>
</collection>
