Hotspot-Limited Microprocessors Direct Temperature and Power Distribution Measurements.

An experimental technique is presented, which allows for spatially-resolved imaging of microprocessor power (SIMP). In a first step this method utilizes infrared (IR) thermal imaging, while the processor is effectively cooled using an IR-transparent heat sink. In the second step the underlying power...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τόπος έκδοσης:	IEEE Journal of solid state circuits 42, 1 (2007).
Κύριος συγγραφέας:	Hamann, H. F.
Μορφή:	Άρθρο
Γλώσσα:	English
Θέματα:	CMOS chips. IR transparent heat sink. PowerPC 970MP microprocessor. SIMP method. Circuit layout. Cooling. Hotspot location. Hotspot-limited chips. Hotspot-limited microprocessors. Infrared thermal imaging. Microprocessor power distribution. Microprocessor temperature distribution. Microprocessor testing. Power distribution measurement. Power-limited chips. Spatially-resolved imaging. Temperature fields. Temperature measurement. Temperature-limited chips.