Hotspot-Limited Microprocessors Direct Temperature and Power Distribution Measurements.

An experimental technique is presented, which allows for spatially-resolved imaging of microprocessor power (SIMP). In a first step this method utilizes infrared (IR) thermal imaging, while the processor is effectively cooled using an IR-transparent heat sink. In the second step the underlying power...

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Publié dans:	IEEE Journal of solid state circuits 42, 1 (2007).
Auteur principal:	Hamann, H. F.
Format:	Article
Langue:	English
Sujets:	CMOS chips. IR transparent heat sink. PowerPC 970MP microprocessor. SIMP method. Circuit layout. Cooling. Hotspot location. Hotspot-limited chips. Hotspot-limited microprocessors. Infrared thermal imaging. Microprocessor power distribution. Microprocessor temperature distribution. Microprocessor testing. Power distribution measurement. Power-limited chips. Spatially-resolved imaging. Temperature fields. Temperature measurement. Temperature-limited chips.