Hotspot-Limited Microprocessors Direct Temperature and Power Distribution Measurements.

Hotspot-Limited Microprocessors Direct Temperature and Power Distribution Measurements.

An experimental technique is presented, which allows for spatially-resolved imaging of microprocessor power (SIMP). In a first step this method utilizes infrared (IR) thermal imaging, while the processor is effectively cooled using an IR-transparent heat sink. In the second step the underlying power...

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Vydáno v:IEEE Journal of solid state circuits 42, 1 (2007).
Hlavní autor: Hamann, H. F.
Médium: Článek
Jazyk:English
Témata:
CMOS chips.
IR transparent heat sink.
PowerPC 970MP microprocessor.
SIMP method.
Circuit layout.
Cooling.
Hotspot location.
Hotspot-limited chips.
Hotspot-limited microprocessors.
Infrared thermal imaging.
Microprocessor power distribution.
Microprocessor temperature distribution.
Microprocessor testing.
Power distribution measurement.
Power-limited chips.
Spatially-resolved imaging.
Temperature fields.
Temperature measurement.
Temperature-limited chips.