A test circuit for measurement of clocked storage element characteristics.

A test circuit for measurement of clocked storage element characteristics.

We present a method, on-chip test circuitry, and an error analysis, for accurate measurement of timing characteristics and power consumption of clocked storage elements. The test circuit was fabricated in 0.11 μm CMOS technology and the measurements performed automatically using a serial scan interf...

תיאור מלא

מידע ביבליוגרפי
הוצא לאור ב:IEEE Journal of solid state circuits 39, 8 (2004).
מחבר ראשי: Nedovic, N.
פורמט: Article
שפה:English
נושאים:
0.11 micron.
CMOS.
Clock-to-output characteristics.
Clocked storage elements.
Data-to-output delay.
Error analysis.
Flip-flops.
Measurement circuit.
On-chip measurement.
On-chip test circuitry.
Power consumption.
Random error.
Serial scan interface.
Systematic measurement error.
Test circuit.
Timing characteristics.