Built-in self-test implementation on ARM7TDM-S microprocessor
The total cost of integrated chips is composed of the design cost, production cost, and testing cost. As integrated chips increase in complexity, testing through automatic test equipment (ATE) becomes very expensive and time-consuming. Built-in self-test (BIST) primarily addresses these problems. Th...
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| מחברים אחרים: | , |
| פורמט: | Thesis |
| שפה: | English |
| יצא לאור: |
2010
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