Built-in self-test implementation on ARM7TDM-S microprocessor

The total cost of integrated chips is composed of the design cost, production cost, and testing cost. As integrated chips increase in complexity, testing through automatic test equipment (ATE) becomes very expensive and time-consuming. Built-in self-test (BIST) primarily addresses these problems. Th...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Esguerra, Ralph Joseph A.
Weitere Verfasser:	Marimla, Josef Ronald A., Retirado, Aga Nasser E.
Format:	Abschlussarbeit
Sprache:	English
Veröffentlicht:	2010
Schlagworte:	Integrated circuits > Testing. Microprocessors > Testing. ARM7TDM-S microprocessor.