Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies.
Substrate noise is a major obstacle for mixed-signal integration. While the power consumption scales linearly with the clock frequency, substrate noise does not have this scaling due to the resonances in the transfer function of the supply current to the substrate. This paper addresses a practical t...
| Xuất bản năm: | IEEE Journal of solid state circuits 38, 7 (2003). |
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| Tác giả chính: | |
| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Những chủ đề: |