Image pattern recognition synthesis and analysis in biometrics - Yanushkevich, Svetlana N.; Nixon, Mark S. (Singapore Hackensack, N.J. World Scientific, 2007)
"Some of the new ideas were first presented at the International Workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."--p. vi.
Keywords: Pattern recognition systems -- Congresses; Pattern recognition systems -- Mathematical models -- Congresses; Biometric identification -- Congresses; Identification -- Automation -- Congresses; Artificial intelligence -- Congresses